A reticle is an optical component that superimposes patterns onto an image or filters light spatially. Its patterns serve as reference standards for alignment, positioning, and measurement of targets or light beams. This series is available in both positive and negative versions: Positive: High-reflectivity chrome patterns on a transparent substrate, typically placed at the image plane to overlay patterns onto the image. Negative: Fully chrome-coated substrate with transparent patterns, ideal for backlit alignment targets and high-brightness applications. Under backlighting, the pattern projects as a dark-field image.
Designed for transmission, these reticles use UV-grade fused silica substrates, offering high transmittance and low birefringence from 193 nm to 2.5 μm. Suitable for laser systems, precision measurement, and imaging applications. For detailed specifications and selection guidance, refer to the model-specific datasheets.
| Material：UV grade Fused Silica | Coating：Chrome plating, cutoff depth ≥ OD3 at 430 nm |
| Dimension Tolerance：+0.0/-0.1mm | Thickness Tolerance：±0.1mm |
| Parallelism：＜3’ | Transmitted wavefront error: < λ @ 633 nm |
| Surface Quality: 60/40 | Line Width Tolerance: ±0.5 µm |
| Type：Positive: Reticle lines and numbers are chrome (opaque), the remaining area is clear (transparent). | |
| Negative： Reticle lines and numbers are clear (transparent), the remaining area is chrome (opaque). | |
| Pitch: Distance between the centerlines of two adjacent reticle lines. | |
| Product Features： Equipped with positive/negative crosshairs, scaled crosshairs, and concentric circle patterns；Available Sizes:** Diameter 19.0 mm, 1 inch (Ø1"). | |
